canadaboy
January 17th, 2007, 02:21 PM
I like the ability to use a 1-parameter Weibull distribution to get an estimate of the unreliability for a given failure mode when some past data is available for the shape parameter. However, one product's failure mode is modeled better with the lognormal distribution than the Weibull. The software does not seem to have the same functionality for the lognormal distribution (ie. 1-parameter Lognormal)
Is there the future possibility of using a 1-parameter lognormal distribution (and specifying the shape parameter while using MLE) to help analyze heavily sensored data with zero or only 1 failure?
Just a future enhancement request, I guess.
Is there the future possibility of using a 1-parameter lognormal distribution (and specifying the shape parameter while using MLE) to help analyze heavily sensored data with zero or only 1 failure?
Just a future enhancement request, I guess.