ALTA 7 question

[maxdeleon]

Hi, I'm a new reliability guy in the semiconductor industry and I was assigned to develop a infant motality and long term prediction failure rate prediction.

As I've heard form other colleagues from other companies, reliasoft's ALTA 7 can help me with this project.

I was looking at some of the cases, but still having difficulties how I'm gonna apply it. Do you guys have a specific case study in the semiconductor industry that is more on the acclerated testing of ICs. Like for example, parts undergoing various stresses, Autoclave, HAST, Temperature Cycle, etc... which I can use as my reference to do in house experiment.

thanks for this big help!!!

[maxdeleon]

here's an example:

Burn-IN stress; biased voltage of 5V @ 130deg/128 hrs.

sample size = 77 units
number of failures = 5
details:
fail 1 = metal stringer
fail 2 = particle defect
fail 3 = electrical overstress
fail 4 = poly stringer
fail 5 = oxide break down

[David]

Hi maxdeleon,

We present an example of how to conduct thermal cycling analysis using ALTA in an article from our HotWire at http://www.weibull.com/hotwire/issue19/hottopics19.htm. Unfortunately, we do not have anything specific for ICs. Additional articles that you might find useful are:

http://www.weibull.com/hotwire/issue53/relbasics53.htm
http://www.weibull.com/hotwire/issue38/hottopics38.htm
http://www.weibull.com/hotwire/issue54/hottopics54.htm

A listing of all our articles is located at http://www.weibull.com/knowledge/pubs_index.htm. The Accelerated Life Testing Reference can also be found at http://www.weibull.com/acceltestwebcontents.htm.

A demo version of ALTA can be downloaded from our Download Store at http://www.reliasoft.info/download/product.php?productid=9&cat=6&page=1.

I hope this helps.